Envision Image Analysis Software

Envision Image Analysis Software

 

Mounting of the specimen after sectioning is often necessary far subsequent handling and Metallographic polishing. Mounting has several benefits, especially in hand polishing when specimen flatness and edge retention are important.

 

Specifications

  • Enhanced lmage Processing (Far lntegrating with the Microscope).

  • Phase Analysis: As per ASTM E562 Quantifies volume % like Graphite, Pearlite, Ferrite, Martensite, Retained Austenite, carbide Porosity etc ..

  • Grain size : As per ASTM E112 Standard methods like Planimetric, Heyn lntercept, Hillard/Abrams circle intercept and manual grain analysis ALA grain size (ASTM E930) analysis.

  • lnclusion rating measurement as per ASTM E45 Standard.

  • Dendrite Arm Spacing far Aluminium.

  • Decarburization as per ASTM E1077.

  • Particle size analysis.

  • Coating Thickness.

  • Nodules: Nodularity Percentage, nodule count and graphite size classes according to valid standards (ASTM A 247).

  • Graphite Flakes: Maximum flake length measurement and Form Types (ASTM A 247).

  • Measurements: like length, area, radius, distance.

  • Report Generation: Exports to MS Office Excel.

  • Camera: 3 MP CMOS.

 

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